High Order Surface Defect Quantitative Detecting Instrument Based on Reverse Recognition Database of Scatter-light Electromagnetic Field Distribution

Edited by:系统管理员fit Date:2017-06-30 10:10

With the help of theoretical simulation model which can simulate the actual imaging environment of defects, the reverse recognition database of defect scatter-light field distribution based on FDTD simulation will be established and the reverse recognition inspection of defects will be achieved by the library of multi-dimensional feature decision models. The 3D reconstruction of 2D subapertures and full-aperture stitching based on projection transformation will be studied.