作者：Tang Xiu, Wu Sai, Chen Gang；等
来源：PROCEEDINGS OF THE ACM ON MANAGEMENT OF DATA 最佳会议论文
会议地点: Seattle, USA 会议时间: JUN 2023
Generation-based testing techniques have shown their effectiveness in detecting logic bugs of DBMS, which are often caused by improper implementation of query optimizers. We propose TQS, a novel testing framework targeted at detecting logic bugs derived by queries involving multi-table joins. Experimental results show that TQS is effective in finding logic bugs of join optimization in database management systems
